Description
SIFT-MS is a direct mass spectrometry technique that doesn’t require chromatographic separation and the associated extended analysis time waiting for individual compounds to elute from the GC column. Autosampler requirements also differ from those of standard GC or GC/MS techniques for which rapid injection techniques are needed: SIFT-MS requires steady sample injection for the duration of the analysis, because injection and analysis are performed simultaneously.
The GERSTEL Multipurpose Sampler (MPS) has proven to be the best-suited standard autosampler for SIFT-MS. Through joint development projects, the MPS and MAESTRO software have been optimized for SIFT-MS analysis providing an integrated system with access to a wide range of sample introduction technologies and applications for routine-, contract- and R&D laboratories.
Available sampling techniques:
- Headspace sampling from headspace vials up to 100 mL volume
- Automated SIFT-MS provides unparalleled throughput for headspace analysis
Multiple Headspace Extraction (MHE)
MHE is a method that enables the calculation of the total amount of a given compound from a limited number of consecutive headspace analysis steps. Using SIFT-MS combined with the GERSTEL MPS, a 6.5-fold increase in throughput is achieved compared to GC/MS.
Tedlar® Bag Sampling
Gas sampling bags provide convenient and cost-effective sampling of VOCs and toxic industrial chemicals (TICs) in ambient air. Due to short residence times in the bag contents have to be analyzed quickly. Automated SIFT-MS provides quick analysis turn-over and high throughput.
Thermal Desorption
TD-SIFT-MS combines the selectivity, high sensitivity and real-time capabilities of SIFT-MS with the flexibility, inertness and efficiency of GERSTEL’s Thermal Desorption Technology.